Assistant Professor – Samuel Ginn College of Engineering
Dr. Guin is an assistant professor in the Department of Electrical and Computer Engineering. He received a Ph.D. in electrical engineering from the University of Connecticut in 2016. He is actively involved in projects in the field of Hardware Security and Trust, Supply Chain Security, Cybersecurity, and VLSI Design and Test. He has developed several on-chip structures and techniques to improve the security, trustworthiness, and reliability of integrated circuits. He is a co-author of the book “Counterfeit Integrated Circuits: Detection and Avoidance”. He has authored several journal articles and refereed conference papers. His projects are sponsored by the National Science Foundation (NSF), Air Force Research Laboratory (AFRL), and Auburn University.
His paper “Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain” is cited on the “White House 100-Day Reviews under Executive Order 14017” on “Building Resilient Supply Chains, Revitalizing American Manufacturing, and Fostering Broad-Based Growth,” June 2021. Also, the team lead by Dr. Guin won 1stplace in Hack@CHES 2021, The Hardware Capture the Flag in Conjunction with International Conference on Cryptographic Hardware and Embedded Systems and 2nd place in Hack@SEC 2021, The Hardware Capture the Flag in Conjunction with USENIX Security Symposium in 2021.
Prof. Guin serves on the organizing committees IEEE International Symposium on Hardware Oriented Security and Trust (HOST), VLSI Test Symposium (VTS) and the IEEE International Conference on Physical Assurance and Inspection of Electronics (PAINE). He has been serving on the technical program committees in several reputed conferences, such as DAC, HOST, VTS, PAINE, VLSID, GLSVLSI, ISVLSI and Blockchain. He is an active participant in the SAE International G-19A Test Laboratory Standards Development Committee and G-32 Cyber-Physical Systems Security Committee. He is a member of both the IEEE and ACM.
